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Partnering with ModuleSci for High-Performance SEM Solutions
Partnering with ModuleSci for High-Performance SEM Solutions
GBIT is proud to partner with ModuleSci, a leader in scientific instruments, to deliver cutting-edge Scanning Electron Microscopes (SEM) to Taiwan’s research and industrial sectors.
ModuleSci was established in 2017 to offer high-resolution SEMs at competitive prices, utilizing advanced technologies such as field emission electron guns and objective lenses developed with the Korea Research Institute of Standards and Science (KRISS).
With a focus on continuous development, ModuleSci provides both standard Tungsten filament SEMs and high-performance FE-SEMs, making advanced imaging and analysis more accessible for materials science, electronics, and nanotechnology applications.
Together, we bring innovative SEM solutions that offer unparalleled performance and value in the global nanotechnology market.
See below for further details on key products.
PV-100 Series
PV-100 Series
Entry-level Tabletop SEM with a tungsten filament electron source.
Compact design ideal for space-constrained laboratories without compromising features.
5-axis motorized stage (X, Y, Z, R, T) for precise sample manipulation.
Fast sample exchange and imaging within 60 seconds.
Wide magnification range from 20x to 300,000x for detailed imaging.
User-friendly GUI simplifying operation for both novice and expert users.
PE-100 Series
PE-100 Series
Compact SEM offering full-size performance.
Standard tungsten filament source, with an optional LaB6 (CeB6) source for enhanced resolution.
Navigation Camera and Chamber Camera for increased versatility in imaging.
Fast sample exchange and imaging within 60 seconds.
Wide magnification range from 20x to 300,000x for detailed observations.
Motorized 5-axis stage (X, Y, Z, R, T) for precise sample handling.
Large chamber accommodates sample sizes up to 100×100×20 mm, with 50 mm XY travel lengths.
PE-300 Series
PE-300 Series
Field Emission (Schottky) SEM offering high resolution and contrast for detailed imaging.
Compact FE electron gun made of mild steel with double O-ring sealing for fast and accurate axis adjustment.
Quick imaging: Obtain SEM images within 90 seconds after loading.
High resolution of 2.0 nm and exceptional contrast for excellent image quality.Motorized 5-axis stage (X, Y, Z, R, T) for precise sample handling.
Large sample chamber accommodates sample sizes up to 150×150×50 mm with 50 mm XYZ travel lengths.
Simplified maintenance and filament exchange for easy upkeep and operational efficiency.
For more information contact us.
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